Material fracture is a quite important issue for structural and functional materials. Crack-tip behavior is among the most basic problems in fracture mechanics. Many theoretical and experimental investigations have been carried out in order to understand the effect of crack-tip plasticity. But a direct near atomic-scale measurement of strain fields of a crack-tip area has not been achieved, which has been a difficult task for many years. The cover presents an experimental investigation for a mode II crack in single-crystal silicon using high-resolution transmission electron microscopy. Particularly, geometric phase analysis method was employed to map the strain fields ... Show All